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http://localhost:8080/xmlui/handle/1/5340Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Parag K Lala | - |
| dc.date.accessioned | 2024-06-28T09:04:49Z | - |
| dc.date.available | 2024-06-28T09:04:49Z | - |
| dc.date.issued | 2024-06 | - |
| dc.identifier.uri | http://localhost:8080/xmlui/handle/1/5340 | - |
| dc.publisher | Academic Press | en_US |
| dc.subject | Electronics and Communication Engineering | en_US |
| dc.title | Digital circuit testing and testability | en_US |
| Appears in Collections: | 1 | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Digital circuit testing testability.pdf | 7.35 MB | Adobe PDF | View/Open |
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